A new scanning mode to improve scanning ion conductance microscopy imaging rate with pipette predicted movement

Publication date: Available online 23 July 2017 Source:Micron Author(s): Jian Zhuang, Yangbohan Jiao, Vincent Mugabo Scanning ion conductance microscopy (SICM) is a non-contact surface topography measurement technique that has been increasingly used for soft surfaces such as living biological samples. An approach-retract scanning (ARS) mode is widely used to avoid collision between the SICM probe (i.e., pipette) and an abrupt increase in sample profile. However, the redundant pipette trajectory in the ARS mode lengthens the scan time, thus reducing SICM efficiency and time resolution. To avoid this problem, a new scanning mode is discussed that adds horizontal movement at each measurement point to predict the upcoming sample topography via variation in ion current. The pipette then retrac...

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